In the secondary ion spectra of complex compounds, isobars with fractional mass differences of long and weighs more than 12 tonnes.
The SHRIMP II ion microprobe is the highest precision instrument in the broad category of Secondary Ion Mass Spectrometers (SIMS).
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Grains of substance to be analyzed (minerals, glass, ceramics, semiconductors and etc.) are mounted in resin and then they are ground and polished in order to expose their internal parts.
Grain size must not be less than 2 - 2,5 diameters of primary beam (most frequently used size of the spot is 15 microns). Grains of the analyzed substance must be located not nearer than 4 mm from the edge of mount.
Final polishing is carried out by diamond abrasive 1 or 1/4 micron.
Examples of Ahrens-Wetherill concordia plots for various types of zircons: Example of plot for local elemental rare-earth analysis in zircons: Example of Tera-Wasserburg plot (observed, uncorrected for common lead) for young zircons: Samples Requirements for the sample preparation for SRHIMP-II Samples for ion microprobe SHRIMP-II are embedded in mounts (polished blocks).
You can send us samples (zircons, other minerals, or glass, ceramics, semiconductors and etc.) and we will prepare them for the analisis.
In addition, when SL13 is used as the calibration standard, the varied ages resulting from that heterogeneity are generally younger than ages derived from the other three standards. Only QGNG and TEMORA 1, when calibrated relative to each other, yield ages on SHRIMP that are consistent with their IDTIMS ages.
Of these two, TEMORA 1 has the distinct advantage of producing consistent IDTIMS ages at high precision.
The high mass resolution of SHRIMP is achieved by the use of double-focussing mass spectrometer (simultaneous energy and mass refocussing) with a very large turning radius of Magnet and Electrostatic Analyser. These secondary ions are gathered using electrostatic lenses and transfered to a mass spectrometer, by which they are separated according to their relative masses.